Full Paper View Go Back

Low Power Programmable Truncated Multiplier Using Error Tolerant Adder

N. Hemalatha1 , K. Kavitha2

Section:Research Paper, Product Type: Isroset-Journal
Vol.4 , Issue.10 , pp.18-24, Oct-2018


Online published on Oct 31, 2018


Copyright © N. Hemalatha, K. Kavitha . This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
 

View this paper at   Google Scholar | DPI Digital Library


XML View     PDF Download

How to Cite this Paper

  • IEEE Citation
  • MLA Citation
  • APA Citation
  • BibTex Citation
  • RIS Citation

IEEE Style Citation: N. Hemalatha, K. Kavitha, “Low Power Programmable Truncated Multiplier Using Error Tolerant Adder,” International Journal of Scientific Research in Multidisciplinary Studies , Vol.4, Issue.10, pp.18-24, 2018.

MLA Style Citation: N. Hemalatha, K. Kavitha "Low Power Programmable Truncated Multiplier Using Error Tolerant Adder." International Journal of Scientific Research in Multidisciplinary Studies 4.10 (2018): 18-24.

APA Style Citation: N. Hemalatha, K. Kavitha, (2018). Low Power Programmable Truncated Multiplier Using Error Tolerant Adder. International Journal of Scientific Research in Multidisciplinary Studies , 4(10), 18-24.

BibTex Style Citation:
@article{Hemalatha_2018,
author = {N. Hemalatha, K. Kavitha},
title = {Low Power Programmable Truncated Multiplier Using Error Tolerant Adder},
journal = {International Journal of Scientific Research in Multidisciplinary Studies },
issue_date = {10 2018},
volume = {4},
Issue = {10},
month = {10},
year = {2018},
issn = {2347-2693},
pages = {18-24},
url = {https://www.isroset.org/journal/IJSRMS/full_paper_view.php?paper_id=910},
publisher = {IJCSE, Indore, INDIA},
}

RIS Style Citation:
TY - JOUR
UR - https://www.isroset.org/journal/IJSRMS/full_paper_view.php?paper_id=910
TI - Low Power Programmable Truncated Multiplier Using Error Tolerant Adder
T2 - International Journal of Scientific Research in Multidisciplinary Studies
AU - N. Hemalatha, K. Kavitha
PY - 2018
DA - 2018/10/31
PB - IJCSE, Indore, INDIA
SP - 18-24
IS - 10
VL - 4
SN - 2347-2693
ER -

281 Views    151 Downloads    186 Downloads
  
  

Abstract :
In VLSI design and testing using CMOS technology a novel error-tolerant adder (ETA) is proposed. The novel ETA is able to achieve the accuracy, and at the same time achieve more improvements in both performance of power consumption and speed. The proposed truncated multiplication reduces part of the power required by multipliers and by only computing the product of the most-significant bits. A novel approach to truncation using ETA is proposed, where a full precision multiplier is implemented. When compared to its conventional counterparts, the proposed ETA is able to attain more than 65% improvement in the Power-Delay Product (PDP). One important dynamic application of the proposed ETA is in digital signal processing systems that can tolerate particular amount of errors.

Key-Words / Index Term :
Adders, low-power design, Modified Baugh Wooley Algorithm, truncated multiplication.

References :
[1] A. B. Melvin, “Let’s think analog,” in Proc. IEEE Comput. Soc. Annu. Symp. VLSI, 2005, pp. 2–5.
[2] A. B. Melvin and Z. Haiyang, “Error-tolerance and multi-media,” in Proc. 2006 Int. Conf. Intell. Inf. Hiding and Multimedia Signal Process. 2006, pp. 521–524.
[3] M. A. Breuer, S. K. Gupta, and T. M. Mak, “Design and error-tolerance in the presence of massive numbers of defects,” IEEE Des. Test Comput., vol. 24, no. 3, pp. 216–227, May-Jun. 2004.
[4] M. A. Breuer, “Intelligible test techniques to support error-tolerance,” in Proc. Asian Test Symp., Nov. 2004, pp. 386–393.
[5] K. J. Lee, T. Y. Hsieh, and M. A. Breuer, “A novel testing methodology based on error-rate to support error-tolerance,” in Proc. Int. Test Conf., 2005, pp. 1136–1144.
[6] I. S. Chong and A. Ortega, “Hardware testing for error tolerant multimedia compression based on linear transforms,” in Proc. Defect and Fault Tolerance in VLSI Syst. Symp., 2005, pp. 523–531.
H.Chung and A. Ortega, “Analysis and testing for error tolerant motion estimation,” in Proc. Defect and Fault Tolerance in VLSI Syst. Symp., 2005, pp. 514–522.
[7] H. H. Kuok, “Audio recording apparatus using an imperfect memory circuit,” U.S. Patent 5414758, May 9, 1995.
[8] T. Y. Hsieh, K. J. Lee, and M. A. Breuer, “Reduction of detected acceptable faults for yield improvement via error-tolerance,” in Proc. Des., Automation and Test Eur. Conf. Exhib., 2007, pp. 1–6.
[9] K. V. Palem, “Energy aware computing through probabilistic switching: A study of limits,” IEEE Trans. Comput., vol. 54, no. 9, pp. 1123–1137, Sep. 2005.
[10] S. Cheemalavagu, P. Korkmaz, and K. V. Palem, “Ultra low energy computing via probabilistic algorithms and devices: CMOS device primitives and the energy-probability relationship,” in Proc. 2004 Int. Conf. Solid State Devices and Materials, Tokyo, Japan, Sep. 2004, pp. 402–403.
[11] P.Korkmaz,B.E.S.Akgul,K.V.Palem,andL.N.Chakrapani,“Advocating noise as an agent for ultra-low energy computing: Probabilistic complementary metal-oxide-semiconductor devices and their characteristics,” Jpn. J. Appl. Phys., vol. 45, no. 4B, pp. 3307–3316, 2006.
[12] J. E. Stine, C. R. Babb, and V. B. Dave, “Constant addition utilizing flagged prefix structures,” in Proc. IEEE Int. Symp. Circuits and Systems (ISCAS), 2005.
[13] L.-D. Van and C.-C. Yang, “Generalized low-error area-efficient fixed width multipliers,” IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 25, no. 8, pp. 1608–1619, Aug. 2005

Authorization Required

 

You do not have rights to view the full text article.
Please contact administration for subscription to Journal or individual article.
Mail us at  support@isroset.org or view contact page for more details.

Go to Navigation